Separate surfaces and defect categories
Panel surfaces, glass edges and films have different normal textures. Define the process stage, inspection surface and acceptance limits for each target.
- Scratches, particles and contamination
- Glass cracks, edge chips and missing corners
- Placement offsets and contour differences
Plan lighting around the material
Transparent and reflective materials may need different lighting configurations. Trial imaging should compare defects with normal patterns, reflections and material-stack variations.
- Confirm transparency and reflection characteristics
- Assess confusion with normal product patterns
- Validate imaging stability across representative batches
Appearance AOI versus illuminated-panel inspection
Surface inspection differs from evaluating display brightness, color, lit-pixel behavior or Mura uniformity. Those requirements need separately defined display states, imaging conditions and acceptance methods.
Move from samples to equipment integration
Confirm defect size and decision criteria, then discuss camera field of view, ROIs, line timing and output data. Rule-based inspection and AI can be evaluated for different parts of the task.
- Provide typical and borderline defects
- Define full-surface versus local inspection
- Confirm PLC handshakes and traceability fields
Frequently asked questions
Can crack and scratch inspection share settings?
Only after validation. Different defects may respond differently to lighting and normal patterns.
Can semiconductor AOI parameters be reused directly?
Material, field of view and acceptance conditions differ. Imaging and decision rules should be validated before reuse.